Precision systems for semiconductor failure analysis, materials science and electron microscopy.
Request information →Micro Support (Japan) designs and manufactures precision sample preparation systems for semiconductor failure analysis, materials science and electron microscopy. Their systems are trusted by leading research institutes and semiconductor manufacturers worldwide.

Precision micro-sampling equipment for extraction and analysis of specific zones on IC chips.
Tools for preparing precise cross-sections for failure analysis.
Specialised systems for Transmission Electron Microscopy sample preparation.
Accessories for high-resolution optical microscopy and inspection.
Contact us for specifications, pricing and availability in the Benelux region.
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